Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D.R. Beaman.

New York ; London : John Wiley, [1975]

xiii, 474 pages : illustrations ; 26 cm

Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973

Copy 1 Supplier/Donor: BMA

Includes bibliographic references and index