The measurement of intelligence : an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale / by Lewis M. Terman.

Boston : Houghton Mifflin ; Cambridge : Riverside Press, [1916], ©1916.

xviii, 362 pages : illustrations ; 20 cm.

Includes bibliographies and index

Copy 1 Supplier/Donor: Polytechnic of East London Note: Spearman's signature on front endpaper. Formerly in the Spearman Collection of the Charles Myers Library at the National Institute of Industrial Psychology. Contains Charles Myers Library bookplate