Scanning electron microscopy 1978 : an international review of advances in instrumentation, techniques, theory and physical applications of the scanning electron microscope / edited by Robert P. Becker and Om Johari.

  • Scanning Electron Microscopy Symposium 1978 : Los Angeles, Calif.)
Date:
[1978]
  • Books

About this work

Publication/Creation

O'Hare : Scanning Electron Microscopy, [1978]

Physical description

2 volumes : illustrations ; 29 cm

Contributors

Bibliographic information

Includes bibliographic references and index

Type/Technique

Languages

Subjects

Holdings

  • [Vol. 2] only

Where to find it

  • [Vol.] 2

    LocationStatusAccess
    Closed stores
    K1834

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