X-ray microscopy and X-ray microanalysis : proceedings of the second international symposium (Stockholmn, 1960) / edited by A. Engström, V. Coslett, H. Pattee.
- International Symposium on X-ray Optics and X-ray Microanalysis 1959 : Stockholm, Sweden)
- Date:
- 1960
- Books
About this work
Publication/Creation
Amsterdam ; London : Elsevier, 1960.
Physical description
x, 542 pages : illustrations ; 25 cm
Notes
Text in English, French, or German.
Copy 1 Supplier/Donor: BMA
Type/Technique
Languages
Subjects
Where to find it
Location Status Access Closed storesK3236